Authors of papers presented at this conference and within the scope of the IEEE Instrumentation and Measurement Magazine may submit a technically extended version to a Special Issue of this Magazine.
The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.