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2018 IEEE INTERNATIONAL WORKSHOP ON
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Metrology for Industry 4.0 & IoT
BRESCIA, ITALY | APRIL 16 - 18, 2018
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2018 IEEE INTERNATIONAL WORKSHOP ON
Metrology for Industry 4.0 & IoT
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Best Conference Paper Award

Description: To recognize the most outstanding paper presented at the annual IEEE International Workshop on Metrology for Industry 4.0 and IoT.

Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.


Best Paper Presented by a Woman

Description: An exclusive plaque will be given for the best paper authored and presented by a woman.

Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.


Best Paper Presented by a Young Researcher

Description: An exclusive plaque will be given for the best paper authored and presented by a researcher younger than 35 years in age.

Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.


SPONSORED BY

innexhub




With the Patronage of

brescia
brescia
unisannio
gmee
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In Collaboration with

gefran
siemens
innexhub